(Q) The following table contains data from ao accelerated life test on Device-C, alf ntegre. circuit….

r193. The following table contains data from ao accelerated life test on Device-C, alf ntegre. circuit. Failures were caused by a chemical reaction inside the it package. Reliability engineers tested 10 circuits at each temperature over a period of 3000 hours, The purpose of the experiment was to estimate Ne aCtiVation energy of the failure-causing reaction and to obtain an estimate of . integrated circuit life .rcibution at 811, jtmction temperature.
Junction Temperature Tea. Recorded Failure TIroes Tfionande of Flours
P.O.0 10 Nene by 3000 hours 125, M None lay 3000 hours 150C 10 1.35,2.5,2.98
(a) For each temperature with failures. pie.. ordered failure time to, versus — .5)/t0 on lognormal probability paper. (b) Repeat pan (a), but use Weibull probability paper. (c) Make a judgment as to Whether. lognormal or the Weibull distribution is a more adequate distribution for these dam

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19.2.docx

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The following table contains data from ao accelerated life test on Device-C, alf ntegre. circuit…. .

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